HOME    MOBILE    SITEMAP    CONTACT    ENGLISH   쇼핑몰            

  HOME >  제품소개> 제품소개 모바일 뷰   




 

조회 수 : 3375
2017.06.04 (13:46:49)
SPM
Product Category:   
Standard:   
Output Properties:   
Application:  Applied Physics
Biosensor and Bioelectronics
Nanotechnology

High-resistance film observation
Amperometric and cyclic voltammetric measurements
Microstructure observation
Electrochemical impedance measurements 

AA3000.jpg

 

AA3000 Scanning Probe Microscope

Combined Scanning Force Microscope(SPM), Atomic Force microscope(AFM) and Lateral ForceMicroscope(LFM)


Introduction
AA3000 Scanning Probe Microscope is a very popular model. This unit is tailored towards research and industry applications, where the user can perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 Scanning Probe Microscope is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.

Features

High Performance

  • Atomic-scale of resolution
  • Large sample size
  • DSP (Digital Signal Processor)- for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer

Multi-Function

  • Atomic Force Microscope (AFM)
  • Scanning Tunneling Microscope (STM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis

Easy Operation

  • Fast automatically tip-engaging
  • Simple change of the tip holder to switch between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades

 

Specifications

Functions

Atomic Force Microscope (AFM)
Scanning Tunneling Microscope(STM)
Lateral Force Microscope (LFM)

Resolution

AFM: 0.26nm lateral, 0.1nm vertical
Scanning Tunneling Microscope(STM)

Technical Parameters

X-Y scan scope:~10 micrometer
Z distance:~2 micrometer
Image Pixels:128X128, 256X256, 512X512, 1024X1024
Scan Angle:0~360 degree
Scan Rate: 0.1~100Hz

Electronics

CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments;
Fast16-bit DAC
Fast16-bit ADC
High Voltage: 5 channel
Communication Interface: 10M/100M Fast Ethernet

Mechanics

Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000; 
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm;

SoftwaresOnline Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x
 
profile
번호
 
321 AA XRF Handheld Portable Energy Dispersive X-ray Fluorescence Spectrometer (휴대형 XRF, X선 형광 분광기)
XRF
Output Properties:
320 AA2000 Atomic Force Microscope
AFM
Output Properties:
Selected AA3000 Scanning Probe Microscope(SPM, 주사탐침현미경)
SPM
Output Properties:
318 AA320N Atomic Absorption Spectrophotometer (AAS; 원자흡광분광광도계)
AAS
Output Properties:
317 AA5000 Multi-function Scanning Probe Microscope(SPM) Systems (다기능 주사탐침현미경)
SPM
Output Properties:
316 AA6000 mini Desktop Scanning Electron Microscope(SEM)
SEM
Output Properties:
315 AA7000 SEM Scanning Electron Microscope
SEM
Output Properties:
314 AA8000 Multi-function Scanning Electron System(SEM)
SEM
Output Properties:
313 AAS500 Atomic Absorption Spectrophotometer (AAS; 원자흡광분광광도계)
AAS
Output Properties:
312 ABT- 9300ST Intelligent Laser Particle Size Analyzer (지능형 레이저 입도분석기)
Particle Size Analyzer
Output Properties:
311 ABT-1001 Intelligent Powder Characteristic Tester (지능형 분말 특성분석기)
Particle Size Analyzer
Output Properties:
310 ABT-1600 Image Particle Size Analyzer (이미지 입도분석기)
Particle Size Analyzer
Output Properties:
309 ABT-1700 Filter Paper cleanliness analyzer
Particle Size Analyzer
Output Properties:
308 ABT-2000 Laser Particle Size Analyzer
Particle Size Analyzer
Output Properties:
307 ABT-2001 Laser Particle Size Analyzer
Particle Size Analyzer
Output Properties:
306 ABT-2900 Image Particle Size & Shape Analysis System (입도 및 형상 이미지 분석시스템)
Particle Size Analyzer
Output Properties:
305 ABT-3000 Laser Particle Size Analyzer
Particle Size Analyzer
Output Properties:
304 ABT-9000 NANO Laser Particle Size Analyzer (나노입도분석기)
Particle Size Analyzer
Output Properties:
303 AC Magnetic Field Probe (A Gauss meter at High frequencies or High field strengths)
NanoScience Labs UK
Output Properties:
302 ADX-2500 X-ray Diffraction Instrument (X선 회절 기기)
XRD
Output Properties:
Tag List

 

회사 소개

 회원이용약관

 개인정보보호정책

 이메일 무단수집 거부

 

 

 

 

 

(우)07783 서울특별시 강서구 곰달래로 208 청송평화빌딩1층(화곡동849-22)

  Phone: 02)2675-0508 (대표) A/S: 02)2675-0566 Telefax: 02)6918-6568


 Copyrightⓒ 2017 YEONJIN S-tech. Scientifics. Ltd. All Rights Reserved. Contact
administrator for more information.