Sample stages, Attachments and chambers
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Four-axis xyzφ stage for large samples to study bulk objects (up to 300 mm diam., up to 250 mm height and up to 50 kg weight) including oddly shaped samples with uneven surfaces, as well as for mapping of phase composition and structural characteristics across sample surface.
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Two-axis χ,φ attachment for analysis of textures and residual stresses in polycrystalline samples and for the determination of crystal orientation up to 28 mm in diameter.
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High-temperature chambers (up to 1200, 1600, 2000 and 2300°С) for in situ tracing of phase transformation and chemical reactions in changeable environment.
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The vacuum system
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Autosampler for 6 positions.
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Registration systems
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X-ray registration system based on linear position-sensitive stripped detector.
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X-ray registration system based on solid-state energy-dispersive Peltier-cooled detector.
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X-ray optical elements
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Versatile primary beam monochromator.
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Versatile diffracted beam monochromator.
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Different types of crystals-monochromators (plane, asymmetric, curved, channel-cut) from different materials.
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One-dimensional parabolic mirror for parallel-beam geometry.
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а 4-bounce channel-cut monochromator (4 x Ge 220) on a primary beam singles out a monochromatic Kα1 line with anglular resolution of about 6” for high resolution geometry.
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Channel-cut monochromator with variable (from 1 to 5) multiplicity on the primary beam singles out monochromatic Kα or Kα1 line . It is used for SAXS measurements and reflectometry.
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Other options
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Closed cooling system (chiller).
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BSV- 27...29 and BSV-40...42 X-ray tubes with different of focus sizes and different anode materials.
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Soller slits with divergence of 1.5 to 4 degrees for collimation of diffracted beam when point or position-sensitive detectors are used.
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β-filters for monochromatization of various X-ray radiations when point or position-sensitive detectors are used.
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