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Thermal Properties Analyzer

Thermal Conductivity (Lambda), Ash Fusion, Thermal Screening, Microscopic Hot/Cold Stage, Wafer Chuck, Thermal Plate, Thermal Probe Station

HS1000GXY-IRM High Temperature Heating Stage

 


  • For IR microscopy & spectroscopy stage
  • 30°C - 1000°C
  • 16 mm X 16mm sample area with wide angle viewing aperture
  • XY sample positioning
  • Closed chamber with gas purging capability. Optional Vacuum-tight sample chamber model

 

Thermal Features

Temperature Control

mK2000 with programmable precision switching PID method

Thermal Block

Ceramic

Sample Thermal Cover

Removable Inner sample cover with additional window

Temperature Minimum

30°C (active cooling not available)

Temperature Maximum

1000°C

Temperature Sensor

S Type Thermocouple

Maximum Heating Rate

+200°C per minute at 100°C

Minimum Heating and Cooling Rate

±0.5°C per minute

Temperature Resolution

0.1°C

Temperature Stability

±1°C

Power supply

115 V or 230 V depending on region

Software

Windows software to record and export temperature-time data

 

Optical Features

Optical access

Reflection and transmission capability

Optical windows

Removable and exchangeable windows permit full-spectrum transparency

Minimum Objective Working Distance

10.0 mm

Minimum Condenser Working Distance

12.5 mm

Top Window

38 mm diameter

Top Viewing Angle

±24.5° from normal

Transmission Aperture

2.0 mm diameter

Bottom Viewing Angle

±10.0° from normal

 

Structural Features

Sample Area

16 mm X 16 mm 

Sample Positioning

10 mm fine travel with Vernier XY dials for remote manipulation in sealed chambers

Atmosphere Control

Gas purging capability to control humidity, condensation, and oxidation

Frame Cooling

Integrated frame cooling with optional chiller system

Window and objective protection

Cooling by purge air

Mounting

Horizontal and vertical mounting capability

Frame Dimensions

200 mm x 120 mm x 30 mm

Weight

1350 g light-weight aluminum body

 



 

 

Instec, Inc. USA
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