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Thermal Properties Analyzer

Thermal Conductivity (Lambda), Ash Fusion, Thermal Screening, Microscopic Hot/Cold Stage, Wafer Chuck, Thermal Plate, Thermal Probe Station

TP102LC4 Specialty Thermal Plate

TP102LC4는 전기 노이즈가 적고 누설 전류없이 온도를 제어하는 자동 액정 테스트 (ALCT) 측정이 가능하도록 합니다. 챔버 온도를 일정하게 유지하면서 액정 특성의 측정을 위해 4 개의 셀을 TP102LC4에 장착 할 수 있습니다. 샘플 측정 간 덮개를 열 필요가 없습니다. 이 챔버는 Instec의 S type 및 SG type LC 셀에 사용하도록 특별히 설계되었습니다. 가드 셀 (SG type)과 함께 사용하면 가드 전극에 전압을 가하여 parasitic capacitance를 줄이고 측정 정확도를 높일 수 있습니다.


 

Features

  • Programmable precision temperature from -30°C to 90°C
  • Precise solid-state heating and cooling
  • Controlled fast heating and cooling rate
  • Electrical shielding and heating capabilities are combined into one unit
  • BNC connections built-in for easily applying electrical fields to samples
  • Linear Variable DC drive is used to eliminate electrical noise during heating for low current measurements
  • Up to four LC samples can be heated/cooled and measured simultaneously by ALCT

 

Technical Specifications

Temperature Range

-30°C  to 90°C

Temperature Resolution

0.01°C

Temperature Stability

±0.05°C  at 37°C

Minimum Heating and Cooling Rate

±0.01°C per minute

Maximum Heating Rate

15°C/minute  at 37°C

Maximum Cooling Rate

-10°C/minute  at 37°C

Temperature Control  Method

Linear Variable DC PID

Temperature Control  Sensor

100  Ω Platinum RTD

 

 

The TP102LC4 allows temperature-controlled Automatic Liquid Crystal Testing (ALCT) measurements to be made with low electrical noise and low leakage. Four cells can be loaded into the TP102LC4 for properties testing while maintaining a constant chamber temperature (opening the lid between samples is not required). This chamber is designed specifically for use with Instec’s S-type and SG-type LC cells. When used together with guarding cells (SG-type), a voltage can be applied to the guarding electrode to reduce parasitic capacitance and enhance measurement accuracy


 

Instec, Inc. USA
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