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Thermal Properties Analyzer

Thermal conductivity (Lambda), Ash fusion, Thermal screening

Microscopic Hot/Cold Stage, Wafer chuck, Thermal plate, Thermal probe station

HS1400V, High temperature microscopy & spectroscopy stage

  • High temperature microscopy & spectroscopy stage

  • 30°C - 1400°C

  • Ø 7.5mm sample area

  • Sealed chamber with vacuum and gas purging capability

 

THERMAL FEATURES

Temperature Control

mK2000 with programmable precision switching PID method

Thermal Block

Ceramic for high temperature work

Temperature Minimum

Room Temperature (active cooling by means of purge gas)

Temperature Maximum

1400°C (Otionally 1500°C)

Temperature Sensor

S Type Thermocouple

Maximum Heating Rate

+100°C/Min ≤800°C, +20/Min >800°C

Minimum Heating and Cooling Rate

±0.5°C per minute

Temperature Resolution

0.1°C

Temperature Stability

±1°C

Power supply

Universal power input

Software

Windows software to record and export  temperature vs.time data

 

OPTICAL FEATURES

Optical access

Reflection and transmission capability

Optical windows

Rotatable to prevent fogging up

Removable and exchangeable windows

Minimum Objective Working Distance

6.8 mm (with 4mm chamber height) or 8.8 mm (with 6mm chamber height)

Minimum Condenser Working Distance

11.75 mm

Top Window

28 mm diameter

Top Viewing Angle

±45° from normal

Transmission Aperture

2 mm diameter

Bottom Viewing Angle

±21.6° from normal

 

STRUCTURAL FEATURES

Sample Area

7.5 mm diameter

Chamber Height

4.0 mm

Atmosphere Control

Sealed chamber with vacuum capability to control humidity, condensation, and oxidation

Includes 1x stainless steel vacuum bellows + 1x machinable aluminum blank by default. Secondary vacuum bellows available by request. 

Frame Cooling

Integrated frame cooling with optional   chiller system

Window and objective protection

Cooling by purge air

Mounting

Horizontal and vertical mounting capability

Frame Dimensions

141 mm x 62 mm x 25.3 mm

Weight

1350 g 

 

 


 

 

 
Instec, Inc. USA
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